LSA

Laser Spectrum Analyzer

Measurement
Speed

Resolving
Power

For Pulsed and
Continous Lasers

No-moving
Part Grating
Technology

Remote Network
Access & Software
Integration

The LSA utilizes an echelle grating and a low order grating in two separate beam paths. The echelle grating provides the LSA with its high resolving power, enabling high accuracy measurements. The low order grating makes it possible to overcome the wavelength indeterminancy of the echelle grating.

Linewidth Measurement

Our OSAs always include the linewidth option automatically. The linewidth can be determined through multiple calculation methods (please contact us for details), and we can accomodate a wide range of customer requests regarding the algorithms used.

Available Measurement Ranges

UV-II

VIS/UV-II

UV-I

VIS Standard

VIS/IR-I

VIS/IR-II

External Trigger Option

All LSAs detect and measure pulsed signals automatically. Additionally, this option allows the user to trigger pulsed measurements externally. The TTL option guarantees synchronization between pulsed excitation and measurement. It provides low-noise signals without parasitic parts when measuring pulsed signals with low duty cycles.

Casing

We are happy to customize the casing of the LSA on your request, including standard 19" casings, and cleanroom-suitable devices.

Compact
Device

19-Inch
Rack-Mount Case

Customization
and OEM Devices

Typical Applications

Multi-line or broadband spectra of light sources up to 2 THz like cw and pulsed lasers, gas discharge lamps, super luminescence diodes, semiconductor laser diodes and LEDs.