Button Wavelength Meter – Standard Series (WS)
Button Wavelength Meter – Rack Series (WR)
Button Wavelength Meter – Fast Series (WF)
Button Spectrometer OSA
Button Linewidth Analyzer
Button Calibration Sources
Button Precision Current Sourcess
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LWA Low-Noise Option

HighFinesse Linewidth Analyzer LWA-1kk

Shifting Sensitivity
to a New Level

The already excellent sensitiviy limits of the Linewidth Analyzers

can now be reduced even more by combining two Analyzer instruments with sophisticated software algorithms.

The upcoming low-noise option opens access to analyze ulta-narrow lasers approaching linewidths of 1 Hz.

Icon Noise Sensitivity down to 3 Hz / √ Hz

Standard Ranges

Noise Floor Limits
with Low-Noise
Option

Icon Noise Sensitivity down to 1 Hz / √ Hz

IR Ranges

Noise Floor Limits
with Low-Noise
Option

Applications

Quantum Computing

Quantum
Computing

Laser Manufacturers

Laser
Manufacturers

Science and Research

Science and
Research

Coming Soon

Representative Data

Name der Grafik

Fig 1: Frequency noise density spectrum of an ECDL with 780 nm PDH-locked to an external cavity measured with LWA-1k 780 in standard (blue) and low-noise option (red).

Name der Grafik

Fig 2: Frequency noise density spectrum of a fiberfaser with 1550 nm measured with the LWA-1k 1550 in standard (blue) and low-noise option (red).

Supported by:

Project Partner

Stay up to Date

If you want to stay informed about the development of

the »Low-Noise Option« for HighFinesse Linewidth Analyzer,

just send a short mail to our service team.

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